Parallel Distributed Infrastructure for Minimization of Energy

Publications

Export 2 results:
2014
Kukner, H., P. Weckx, P. Raghavan, B. Kaczer, F. Catthoor, L V. der Perre, R. Lauwereins, and G. Groeseneken, "BTI reliability from Planar to FinFET nodes Will the next node be more or less reliable?", The Third Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN'14) Co-Located with DATE 2014, Dresden, Germany, 03/2014.
Kukner, H., M. Khatib, S. Morrison, P. Weckx, P. Raghavan, B. Kaczer, F. Catthoor, L V. der Perre, R. Lauwereins, and G. Groeseneken, "Degradation Analysis of Datapath Logic Subblocks under NBTI Aging in FinFET Technology", The International Symposium on Quality Electronic Design (ISQED 2014), Santa Clara, California, USA, IEEE, 03/2014.